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Description

SCM-PTSI2. 8N m, 75kHz, 4 Sided Tip, Conductive PtSi Coating DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS Bruker SCM PtSi Probes For the highest resolution nanoelectrical measurements with outstanding wear resistance. Bruker's new platinum silicide AFM probe is the ideal choice for Scanning Capacitance Microscopy measurements on the most advanced semiconductor features, providing the highest resolution imaging and long tip lifetime due to its

or probes in the unmounted probe carrier (model 00-107-0091)

Quantitative and repeatable measurements for over 24 hours of continuous use have been demonstrated with these probes

the RESP is the industry standard for high-performance and high-quality imaging on a wide variety of sample types

Cantilever Material: 1 Ωcm Silicon Cantilever Thickness (Nom): 2 Cantilever Thickness (RNG): 1

Super Sharp Conductive Single Crystal Diamond Probes

A pack of Silicon Nitride Probes

-- Perfluoro elastomer (FFKM) for maximum solvent compatibility

ICON-PFQNM

This AFM probe is unmounted for use on any AFM and is also available with Aluminum reflex coating as model RTESPA-300

5 Tip Set Back( RNG): 0 - 7

5º Back Angle: 1 - 14 Side Angle: 22

All die are 8mm x 8mm and unmounted