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Description

AC-SPKDESCRIPTION This kit contains a selection of parts often used to mount samples for AFM based analysis. The kit contains 20 12mm steel sample pucks, a sheet of 50 adhesive dots for adhering the sample to the steel pucks, and tweezers.

5 Front Angle: 35 ± 1 Back Angle: 35 ± 1 Side Angle: 35 ± 1 Tip Radius (Nom): 50 ± 10 Tip Coating: TiW

Certified Standard is a select grade

the visible apex tip is a tilted tip

with "A" and "B" cantilevers on one side of the probe

They are designed for use with the Direct Drive Fluid Cantilever Holder and 35mm petri dishes and are available as replacement parts in packages of five

Tilt-Compensated High Aspect Ratio (5:1) Focused Ion Beam (FIB) probes for high resolution TappingMode imaging on samples with tall/deep geometries

- Controlled 30nm end radius

and a certificate of calibration from Bruker

Focused Ion Beam (FIB) probes consist of an integrated single crystal TESP silicon cantilever and tip that have been machined (or shaped) toobtain the desired high aspect ratio

Our goal is to provide improved user results in consistencyof rendered resolution and less variation to instrument settings

force modulation microscopy

Each probe tip is individually imagedby FE-SEM to verify that the metallic probe tip radius is below 20nm

Exchange/Return Notes