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Description

SiNiSilicon Nitride AFM Probe with 2 Different Cantilevers on Each Side of the Chip DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS Silicon Nitride AFM Probe with 2 Different Cantilevers on Each Side of the Chip This competitively priced silicon nitride AFM probe features: 2 silicon nitride cantilevers for soft contact mode with two different lengths and force constants mounted on each side of a standard silicon support chip silicon nitride wedge

Width x Thickness 5367-14NM PELCO® Pro High Precision

Slotted Mesh

Scanning Microscopies and Profilometry: STM

Cut-outs are provided for easy wafer removal except for 5"

Available in 6

Width x Thickness 5622 DUMOSTAR High Precision 5 110mm SS 0

they are truly unique

2mm (Ø4" x 1/8")

Sizes available are 12

Representative Certificate of Suitability for Purpose - for PELCO® XCS-12 Calibration Standard (244KB PDF)

Probes can be heated repeatedly and reliably to higher temperatures (350°C) than other thermal probes made of thin metal films

StrataTek™ Hexagonal Grids