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RTESP-30040N m, 300kHz, Symmetric Tip, No Coatings, 10 Pack DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS A pack of 10 High quality etched silicon probes for TappingMode and other non contact modes. Unmounted for use on standard AFM's. Bruker's flagship MPP probes are the preferred choice for high sensitivity silicon probe imaging in TappingMode or non contact mode in air. Every aspect of the MPP design has been optimized to provide the most

50 Cantilever Geometry: Rectangular Cantilevers Number: 1 Front Side Coating: Magnetic CoCr Back Side Coating: Reflective CoCr

with reflective coating

Designed for PeakForce Tapping operation on Dimension Icon

A 10-pack of sharp nitride lever probes ideally suited for Peak Force Quantitative Nano-Electric measurements

Other applications of the DDESP-V2 probe include: Scanning Capacitance Microscopy (SCM)

2500nm tall spike with 30nm end radius and 150nm base width

ESP/ESPA AFM probes

Bruker AFM Probes has introduced an improved version of its popular MLCT AFM probes

For the highest resolution nanoelectrical measurements with outstanding wear resistance

Titanium roughness sample pre-mounted on 12mm magnetic sample disk

The MESP-V2 has a nominal coercivity of 400 Oe (medium)

Bruker AFM Probes has introduced an improved version of its popular